Inference for a Simple Step-Stress Model with Type-I Censoring and Lognormally Distributed Lifetimes

Accelerated life-testing (ALT) is a very useful technique for examining the reliability of highly reliable products. It allows the experimenter to obtain failure data more quickly at increased stress levels than under normal operating conditions. A step-stress model is one special class of ALT, and in this article we consider a simple step-stress model under the cumulative exposure model with lognormally distributed lifetimes in the presence of …