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Spinodal wrinkling in thin-film poly(ethylene...
Journal article

Spinodal wrinkling in thin-film poly(ethylene oxide)/polystyrene bilayers

Abstract

Abstract.Optical microscopy and atomic force microscopy were used to study a novel roughness-induced wrinkling instability in thin-film bilayers of poly(ethylene oxide) (PEO) and polystyrene (PS). The observed wrinkling morphology is manifested as a periodic undulation at the surface of the samples and occurs when the bilayers are heated above the melting temperature of the semi crystalline PEO (Tm = 63 $$\ensuremath ^{\circ}{\rm C}$$) layer. …

Authors

Sharp JS; Vader D; Forrest JA; Smith MI; Khomenko M; Dalnoki-Veress K

Journal

The European Physical Journal E, Vol. 19, No. 4, pp. 423–432

Publisher

Springer Nature

Publication Date

April 2006

DOI

10.1140/epje/i2005-10057-y

ISSN

1292-8941