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Quantitative surface analysis with elemental...
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Quantitative surface analysis with elemental standards: Surface roughness limitations

Abstract

The dependence of the detected Auger signal on crystal orientation and surface morphology has been investigated for a pure elemental standard of Mo. Two large adjacent grains with orientations close to (100) and (1, 4, 11) were used for this study. After polishing to a uniform surface topograpy the sample was sputtered with 2 keV argon ions at glancing incidence, typical of the conditions used in surface analysis. The initial line scan across …

Authors

Dawson PT; Petrone SA

Volume

9

Pagination

pp. 1234-1236

Publisher

American Vacuum Society

Publication Date

May 1, 1991

DOI

10.1116/1.577604

Conference proceedings

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Issue

3

ISSN

0734-2101

Labels

Fields of Research (FoR)