Conference
Quantitative surface analysis with elemental standards: Surface roughness limitations
Abstract
The dependence of the detected Auger signal on crystal orientation and surface morphology has been investigated for a pure elemental standard of Mo. Two large adjacent grains with orientations close to (100) and (1, 4, 11) were used for this study. After polishing to a uniform surface topograpy the sample was sputtered with 2 keV argon ions at glancing incidence, typical of the conditions used in surface analysis. The initial line scan across …
Authors
Dawson PT; Petrone SA
Volume
9
Pagination
pp. 1234-1236
Publisher
American Vacuum Society
Publication Date
May 1, 1991
DOI
10.1116/1.577604
Conference proceedings
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
Issue
3
ISSN
0734-2101