Journal article
Few-Shot Learning for Fault Diagnosis With a Dual Graph Neural Network
Abstract
Mechanical fault diagnosis is crucial to ensure the safe operations of equipment in intelligent manufacturing systems. Deep learning-based methods have been recently developed for fault diagnosis due to their advantages in feature representation. However, most of these methods fail to learn relations between samples and thus perform poorly without sufficient labeled data. In this article, we propose a new few-shot learning method named dual …
Authors
Wang H; Wang J; Zhao Y; Liu Q; Liu M; Shen W
Journal
IEEE Transactions on Industrial Informatics, Vol. 19, No. 2, pp. 1559–1568
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
DOI
10.1109/tii.2022.3205373
ISSN
1551-3203