Conference
Analytical Expressions for Field-based Response Sensitivity Analysis and Their Application in Microwave Design and Imaging
Abstract
Authors
Nikolova NK; Kazemivala R
Volume
00
Pagination
pp. 104-106
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 24, 2022
DOI
10.1109/ims37962.2022.9865470
Name of conference
2022 IEEE/MTT-S International Microwave Symposium - IMS 2022