De‐noising algorithm for enhancing microwave imaging

An algorithm for the de‐noising of S ‐parameter data used in microwave imaging is proposed. The complex S ‐parameter frequency‐sweep data are collected through scans over an acquisition surface and the algorithm separates efficiently the resulting two‐dimensional responses (one frequency at a time) into a signal and a noise component. The separation is performed with an iterative procedure similar to the empirical mode decomposition. The signal component estimates the noise‐free data, whereas the remaining data content estimates the noise and uncertainty in the measurement. The algorithm performance is verified with measured data.