Conference
Near-field microwave imaging based on planar aperture scanning
Abstract
Authors
Amineh RK; Ravan M; Trehan A; Nikolova NK
Pagination
pp. 1-1
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 1, 2010
DOI
10.1109/mwsym.2010.5516719
Name of conference
2010 IEEE MTT-S International Microwave Symposium
Conference proceedings
IEEE MTT-S International Microwave Symposium digest
ISSN
0149-645X