Conference
New method for exact self-adjoint sensitivity analysis of metallic shapes
Abstract
Authors
Dadash MS; Moussakhani K; Nikolova NK; Liu L
Pagination
pp. 1-1
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2011
DOI
10.1109/mwsym.2011.5973216
Name of conference
2011 IEEE MTT-S International Microwave Symposium
Conference proceedings
IEEE MTT-S International Microwave Symposium digest
ISSN
0149-645X