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Automated trace signals identification and state restoration for improving observability in post-silicon validation
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Additional Document Info
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Overview
authors
Ko, Ho Fai
Nicolici, Nicola
status
published
publication date
March 10, 2008
published in
Proceedings of the conference on Design, automation and test in Europe
Journal
presented at event
DATE '08: Design, Automation and Test in Europe
Conference
Research
keywords
40 Engineering
4008 Electrical Engineering
4009 Electronics, Sensors and Digital Hardware
Identity
Digital Object Identifier (DOI)
10.1145/1403375.1403689
Additional Document Info
start page
1298
end page
1303