Conference
Scan latch partitioning into multiple scan chains for power minimization in full scan sequential circuits
Authors
Nicolici N; Al-Hashimi BM
Pagination
pp. 715-722
Publisher
Association for Computing Machinery (ACM)
Publication Date
January 1, 2000
DOI
10.1145/343647.343901
Name of conference
Proceedings of the conference on Design, automation and test in Europe