Beyond DFT: The Convergence of DFM, Variability, Yield, Diagnosis and Reliability

The tutorial goal is to show how design for yield (DFY) and design for manufacturability (DFM) are tightly coupled into what we conventionally think of as test. As process geometries shrink, the line between defects and process variation blurs to the point where it is essentially non-existent. The basics of yield and what fabs do to improve defectivity and manage yield are described. DFM techniques to analyze the design content, flag areas of design that could limit yield, and make changes to improve yield are discussed. This tutorial will provide background needed for DFT practitioners to understand DFM and DFY, and see how their work relates to it. The ultimate goal is to spur attendees to conducting their own research in the area, and to apply these concepts in their jobs.