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Characterization of Sequentially Plasma Activated...
Journal article

Characterization of Sequentially Plasma Activated Silicon, Silicon Dioxide and Germanium Surfaces and Bonded Interfaces for Low Temperature Applications

Authors

Kibria MG; Zhang F; Cormier K; Howlader M

Journal

ECS Meeting Abstracts, Vol. MA2010-02, No. 27, pp. 1750–1750

Publisher

The Electrochemical Society

Publication Date

July 8, 2010

DOI

10.1149/ma2010-02/27/1750

ISSN

2151-2043

Labels

Fields of Research (FoR)