Conference
Development of online whole-surface apple inspection system using line-scan hyperspectral imaging technology (Conference Presentation)
Authors
Baek I; Gadsden SA; Kim MS
Publisher
SPIE, the international society for optics and photonics
Publication Date
May 15, 2018
DOI
10.1117/12.2307235
Name of conference
Sensing for Agriculture and Food Quality and Safety X