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A new charge pumping method for determining the spatial interface state density distribution in MOSFETs
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Additional Document Info
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Overview
authors
Li, XM
Deen, Jamal
status
accepted
publication date
January 1, 1990
published in
Technical Digest - International Electron Devices Meeting
Journal
presented at event
International Technical Digest on Electron Devices
Conference
Research
keywords
40 Engineering
4018 Nanotechnology
Identity
Digital Object Identifier (DOI)
10.1109/iedm.1990.237220
Additional Document Info
start page
85
end page
87