Approaches to Reduced-Defect Active Regions for III-N Devices Academic Article uri icon

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abstract

  • Abstract not Available.

authors

  • Eddy, Charles R
  • Mastro, Michael
  • Bassim, Nabil
  • Twigg, Mark
  • Henry, Richard
  • Holm, Ronald
  • Culbertson, James
  • Glembocki, Orest
  • Caldwell, Joshua D
  • Neudeck, Phillip
  • Trunek, Andrew
  • Powell, J Anthony
  • Peckerar, Martin
  • Ngu, Yves
  • Yan, Feng
  • Babu, Sachidananda

publication date

  • June 30, 2006