Journal article
Approaches to Reduced-Defect Active Regions for III-N Devices
Authors
Eddy CR; Mastro M; Bassim N; Twigg M; Henry R; Holm R; Culbertson J; Glembocki O; Caldwell JD; Neudeck P
Journal
ECS Meeting Abstracts, Vol. MA2006-02, No. 32, pp. 1539–1539
Publisher
The Electrochemical Society
Publication Date
June 30, 2006
DOI
10.1149/ma2006-02/32/1539
ISSN
2151-2043