Journal article
The symbolic defect of an ideal
Abstract
Authors
Galetto F; Geramita AV; Shin Y-S; Van Tuyl A
Journal
Journal of Pure and Applied Algebra, Vol. 223, No. 6, pp. 2709–2731
Publisher
Elsevier
Publication Date
June 1, 2019
DOI
10.1016/j.jpaa.2018.11.019
ISSN
0022-4049