Journal article
Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution
Abstract
This paper develops a new family of estimators, the minimum density power divergence estimators (MDPDEs), for the parameters of the one-shot device model as well as a new family of test statistics, Z-type test statistics based on MDPDEs, for testing the corresponding model parameters. The family of MDPDEs contains as a particular case the maximum likelihood estimator (MLE) considered in Balakrishnan and Ling (2012). Through a simulation study, …
Authors
Balakrishnan N; Castilla E; Martín N; Pardo L
Journal
IEEE Transactions on Information Theory, Vol. 65, No. 5, pp. 3080–3096
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 1, 2019
DOI
10.1109/tit.2019.2903244
ISSN
0018-9448