Conference
Deep-learning algorithms for imperfection-resilient Fourier-transform spectroscopy in silicon
Abstract
Authors
Mokeddem Z; Melati D; González-Andrade D; Dinh TTD; Montesinos-Ballester M; Cassan E; Marris-Morini D; Grinberg Y; Cheben P; Xu D-X
Volume
00
Pagination
pp. 1-2
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
December 10, 2021
DOI
10.1109/gfp51802.2021.9673932
Name of conference
2021 IEEE 17th International Conference on Group IV Photonics (GFP)