Conference
Trace-Checking CPS Properties: Bridging the Cyber-Physical Gap
Abstract
Authors
Menghi C; ViganĂ² E; Bianculli D; Briand LC
Volume
00
Pagination
pp. 847-859
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 30, 2021
DOI
10.1109/icse43902.2021.00082
Name of conference
2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE)