Conference
ThEodorE: a Trace Checker for CPS Properties
Abstract
Authors
Menghi C; ViganĂ² E; Bianculli D; Briand LC
Volume
00
Pagination
pp. 183-184
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 28, 2021
DOI
10.1109/icse-companion52605.2021.00079
Name of conference
2021 IEEE/ACM 43rd International Conference on Software Engineering: Companion Proceedings (ICSE-Companion)