Conference
Automated Test Data Generation and Reliability Assessment for Software in High Assurance Systems
Abstract
Authors
Murrill BW
Pagination
pp. 409-410
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 1, 2007
DOI
10.1109/hase.2007.63
Name of conference
10th IEEE High Assurance Systems Engineering Symposium (HASE'07)