Conference
Improving Land Surface Pixel Level Albedo Characterization Using Sub-Pixel Information Retrieved from Remote Sensing
Abstract
Authors
Liu W; Hu B; Wang S
Volume
2
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
July 1, 2008
DOI
10.1109/igarss.2008.4779115
Name of conference
IGARSS 2008 - 2008 IEEE International Geoscience and Remote Sensing Symposium