Conference
Development and validation of a Monte Carlo simulation tool for multi-pinhole microSPECT
Abstract
Authors
Mok SP; Tsui BMW; Wang Y; Qi Y; Du Y; Segars WP; Yoder BC; Frey EC
Volume
6
Pagination
pp. 3440-3444
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2004
DOI
10.1109/nssmic.2004.1466627
Name of conference
IEEE Symposium Conference Record Nuclear Science 2004.