authors Rodriguez, Salvador Valtierra Frick, Mathieu Quitoriano, Nathaniel Ofori-opoku, Nana Provatas, Nikolas Bevan, Kirk H
keywords Critical Thickness Defect Nucleation Dislocation Dynamics Epitaxial Growth GE MISFIT MODES MOLECULAR-BEAM EPITAXY Materials Science Materials Science, Multidisciplinary NUCLEATION Phase-field Crystal Modeling SI STRAIN Science & Technology Technology