Conference
Direct calculation of the MOSFET high frequency noise parameters
Abstract
This paper presents for the first time a method to directly calculate the noise parameters (minimum noise figure NFmin , equivalent noise resistance Rn , and optimized source resistance Ropt and reactance Xopt ) of MOSFETs based on HSPICE level 3 model. All physically-based high frequency noise sources - thermal noise from the channel, gate, source and drain resistances, induced gate noise and their correlations are considered, and the impact of …
Authors
Chen CH; Deen MJ
Pagination
pp. 488-491
Publication Date
December 1, 1997
Conference proceedings
Proceedings of the International Conference on Noise in Physical Systems and 1 F Fluctuations