The use of constant-resistance DLTs to study proton radiation damages in CCD output MOSFETs Conferences

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authors

Kolev, PV
Hardy, T
Deen, Jamal
Murowinski, R

status

published

publication date

January 1, 1997

published in

PROCEEDINGS OF THE ELECTROCHEMICAL SOCIETY SYMPOSIUM ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS AND DEVICES Journal

presented at event

Diagnostic Techniques for Semiconductor Materials and Devices Symposium at the Electrochemical-Society Meeting Conference