Hot-carrier defect length propagation in LDD NMOSFETs Conferences

authors

• Raychaudhuri, A
• Kwan, WS
• Deen, Jamal
• King, MIH

status

• published 

publication date

• January 1, 1997

published in

• PROCEEDINGS OF THE SYMPOSIUM ON SILICON NITRIDE AND SILICON DIOXIDE THIN INSULATING FILMS  Journal

presented at event

• Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films  Conference

keywords

• Electrochemistry
• Materials Science
• Materials Science, Characterization & Testing
• Materials Science, Coatings & Films
• Physical Sciences
• Science & Technology
• Technology

International Standard Book Number (ISBN) 10

• 1-56677-137-4

start page

• 242

end page

• 258

volume

• 97

issue

• 10