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A STUDY ON HOOGE EMPIRICAL 1/F NOISE RELATION IN...
Conference

A STUDY ON HOOGE EMPIRICAL 1/F NOISE RELATION IN SEMICONDUCTORS

Authors

ZHU Y; DEEN MJ

Editors

Handel PH; Chung AL

Series

AIP CONFERENCE PROCEEDINGS

Volume

282

Pagination

pp. 76-90

Publisher

AIP PRESS

Publication Date

1993

ISBN-10

1-56396-252-7

Name of conference

5TH VAN DER ZIEL SYMP ON QUANTUM 1/F NOISE AND OTHER LOW-FREQUENCY FLUCTUATIONS IN ELECTRONIC DEVICES

Conference place

MO, ST LOUIS

Conference start date

May 22, 1992

Conference end date

May 23, 1992

Conference proceedings

QUANTUM 1/F NOISE & OTHER LOW FREQUENCY FLUCTUATIONS IN ELECTRONIC DEVICES

ISSN

0094-243X