RF modeling of MOSFETs Conferences

authors

• Deen, Jamal
• Chen, Chih-hung
• Naseh, S
• Cheng, Yuhua
• Matloubian, M

status

• published 

publication date

• October 24, 2000

published in

• Proceedings of SPIE - The International Society for Optical Engineering  Journal

presented at event

• International Symposium on Microelectronics and Assembly  Conference

keywords

• Computer Science
• Computer Science, Hardware & Architecture
• DESIGN
• Engineering
• Engineering, Electrical & Electronic
• FIELD-EFFECT TRANSISTORS
• HIGH-FREQUENCY NOISE
• Physical Sciences
• Physics
• Physics, Condensed Matter
• RF MOS
• RF MOS models
• RF MOS noise modeling
• RF MOS noise parameters
• RF modeling
• RFICs
• Science & Technology
• Technology

Digital Object Identifier (DOI)

• 10.1117/12.405405

International Standard Book Number (ISBN) 10

• 0-8194-3900-2

start page

• 138

end page

• 152

volume

• 4228