Conference
Low-frequency noise and random telegraph noise in SiGe:C heterojunction bipolar transistors: impact of carbon concentration
Authors
Raoult J; Delseny C; Pascal F; Marin M; Deen MJ
Volume
6600
Publisher
SPIE, the international society for optics and photonics
Publication Date
June 7, 2007
DOI
10.1117/12.724559
Name of conference
Noise and Fluctuations in Circuits, Devices, and Materials
Conference proceedings
Proceedings of SPIE--the International Society for Optical Engineering
ISSN
0277-786X