DC and thermal noise modeling of 20 nm double-gate junctionless MOSFETs Conferences

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authors

Jeong, Eui-Young
Jeong, Yoon-Ha
Chen, Chih-hung
Deen, Jamal

status

published

publication date

June 2013

published in

2013 22nd International Conference on Noise and Fluctuations (ICNF) Journal

presented at event

2013 International Conference on Noise and Fluctuations (ICNF) Conference