Physical DC and thermal noise models of 18 nm double-gate junctionless p-type MOSFETs for low noise RF applications Conferences

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authors

Jeong, Eui-Young
Deen, Jamal
Chen, Chih-hung
Baek, Rock-Hyun
Lee, Jeong-Soo
Jeong, Yoon-Ha

status

published

publication date

April 1, 2015

has subject area

published in

Japanese Journal of Applied Physics Journal

presented at event

International Conference on Solid State Devices and Materials (SSDM 2014) Conference