Physical DC and thermal noise models of 18 nm double-gate junctionless p-type MOSFETs for low noise RF applications Conference Paper uri icon

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authors

  • Jeong, Eui-Young
  • Deen, Jamal
  • Chen, Chih-Hung
  • Baek, Rock-Hyun
  • Lee, Jeong-Soo
  • Jeong, Yoon-Ha

publication date

  • April 1, 2015