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Low-Frequency Noise in Bilayer MoS2 Transistor
Journal article

Low-Frequency Noise in Bilayer MoS2 Transistor

Abstract

Low-frequency noise is a significant limitation on the performance of nanoscale electronic devices. This limitation is especially important for devices based on two-dimensional (2D) materials such as graphene and transition metal dichalcogenides (TMDs), which have atomically thin bodies and, hence, are severely affected by surface contaminants. Here, we investigate the low-frequency noise of transistors based on molybdenum disulfide (MoS2), …

Authors

Xie X; Sarkar D; Liu W; Kang J; Marinov O; Deen MJ; Banerjee K

Journal

ACS Nano, Vol. 8, No. 6, pp. 5633–5640

Publisher

American Chemical Society (ACS)

Publication Date

June 24, 2014

DOI

10.1021/nn4066473

ISSN

1936-0851