Journal article
Low-Frequency Noise in Bilayer MoS2 Transistor
Abstract
Low-frequency noise is a significant limitation on the performance of nanoscale electronic devices. This limitation is especially important for devices based on two-dimensional (2D) materials such as graphene and transition metal dichalcogenides (TMDs), which have atomically thin bodies and, hence, are severely affected by surface contaminants. Here, we investigate the low-frequency noise of transistors based on molybdenum disulfide (MoS2), …
Authors
Xie X; Sarkar D; Liu W; Kang J; Marinov O; Deen MJ; Banerjee K
Journal
ACS Nano, Vol. 8, No. 6, pp. 5633–5640
Publisher
American Chemical Society (ACS)
Publication Date
June 24, 2014
DOI
10.1021/nn4066473
ISSN
1936-0851