Conference
Developing a methodology for the electron energy-loss spectroscopy of defects in GaN
Authors
Natusch MKH; Botton GA; Humphreys CJ
Editors
Cullis AG; Hutchison JL
Series
INSTITUTE OF PHYSICS CONFERENCE SERIES
Pagination
pp. 213-216
Publisher
IOP PUBLISHING LTD
Publication Date
January 1, 1997
ISBN-10
0-7503-0464-2
Name of conference
Royal-Microscopical-Society Conference on Microscopy of Semiconducting Materials
Conference place
UNIV OXFORD, OXFORD, ENGLAND
Conference start date
April 7, 1997
Conference end date
April 10, 1997
Conference proceedings
MICROSCOPY OF SEMICONDUCTING MATERIALS 1997
Issue
157
ISSN
0951-3248