Electron beam damage in titanium dioxide films Conferences

authors

• Saifullah, MSM
• Boothroyd, CB
• Botton, Gianluigi
• Humphreys, CJ

status

• published 

publication date

• January 5, 2022

published in

• Institute of Physics Conference Series  Journal

presented at event

• 1997 Biennial Meeting of the Electron-Microscopy-and-Analysis-Group of the Institute-of-Physics (EMAG 97)  Conference

keywords

• Crystallography
• MICROSCOPE
• Materials Science
• Materials Science, Multidisciplinary
• Microscopy
• Physical Sciences
• Physics
• Physics, Multidisciplinary
• Science & Technology
• Technology

Digital Object Identifier (DOI)

• 10.1201/9781003063056-43

International Standard Book Number (ISBN) 10

• 0-7503-0441-3

start page

• 167

end page

• 170

issue

• 153