Conference
Evidence for charged defects in wurtzite GaN from spatially resolved electron energy-loss spectroscopy
Authors
Natusch MKH; Botton GA; Humphreys CJ
Editors
Benavides HAC; Yacaman MJ
Pagination
pp. 391-392
Publisher
IOP PUBLISHING LTD
Publication Date
January 1, 1998
ISBN-10
0-7503-0566-5
Name of conference
14th International Congress on Electron Microscopy
Conference place
CANCUN, MEXICO
Conference start date
August 31, 1998
Conference end date
September 4, 1998
Conference proceedings
ELECTRON MICROSCOPY 1998, VOL 3