Conference
A New Tree Similarity Measuring Method and its Application to Ontology Comparison
Abstract
Authors
Xue Y; Wang C; Ghenniwa HH; Shen W
Pagination
pp. 258-263
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
April 1, 2008
DOI
10.1109/cscwd.2008.4536991
Name of conference
2008 12th International Conference on Computer Supported Cooperative Work in Design