Conference
Fast Anomaly Detection in Micro Data Centers Using Machine Learning Techniques
Abstract
Authors
Nanekaran NP; Esmalifalak M; Narimani M
Volume
1
Pagination
pp. 86-93
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
July 23, 2020
DOI
10.1109/indin45582.2020.9442233
Name of conference
2020 IEEE 18th International Conference on Industrial Informatics (INDIN)