The generalized linear model‐based exponentially weighted moving average and cumulative sum charts for the monitoring of high‐quality processes

Abstract In this industry 4.0 revolution, most of the manufacturing processes are equipped with the digital devices which are continuously recording the data. To monitor the quality of a manufacturing system, variable about number of conforming or nonconforming items is usually used and statistical analysis based on it is further utilized for developing the policies. In this era of sophisticated and modern technology, most of the manufacturing systems are producing near zero‐defect items. Such processes are known as high‐quality processes, and their dataset consists of excess number of zeros. Generally, the zero excess or near zero‐defect dataset is well fitted by the zero‐inflated distributions, and the zero‐inflated Poisson (ZIP) and zero‐inflated Negative Binomial (ZINB) distributions are the most common models. Most of the time, in high‐quality processes, few covariates are also measured along with defect counts. Hence, to model such processes, generalized linear model (GLM) based on ZIP and ZINB distributions are used to fit the data. In monitoring perspective, data‐based control charts are designed to monitor high‐quality datasets while the GLM‐based control charts based on the residuals of the GLM models are used to monitor a change in the mean of the zero excess datasets. In this study, we have developed memory‐type data‐based and GLM‐based control charts (i.e., exponentially weighted moving average and cumulative sum) to monitor the increasing average defect counts in a high‐quality process. Further, the proposed methods are evaluated using run‐length properties and compared with its competitive charts. Furthermore, to highlight the importance of the study, the proposed methods are implemented on a dataset concerning the number of flight delays between Atlanta and Orlando airports.