Conference
Modified Tip-enhanced Raman spectroscopy to detect a monolayer of Reverse Micelles
Abstract
Authors
Hui LS; Arbi RI; Turak A; Dittrich M
Volume
00
Pagination
pp. 1-2
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 28, 2020
DOI
10.1109/pn50013.2020.9166965
Name of conference
2020 Photonics North (PN)