Conference
NTIRE 2020 Challenge on Image Demoireing: Methods and Results
Abstract
Authors
Yuan S; Timofte R; Leonardis A; Slabaugh G; Luo X; Zhang J; Qu Y; Hong M; Xie Y; Li C
Volume
00
Pagination
pp. 1882-1893
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 19, 2020
DOI
10.1109/cvprw50498.2020.00238
Name of conference
2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)