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Characterization and modeling of high-frequency noise in MOSFETs for RF IC design
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Identity
Additional Document Info
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Overview
authors
Chen, Chih-hung
Asgaran, S
Li, F
Deen, MJ
status
published
publication date
January 1, 2004
published in
Proceedings of SPIE - The International Society for Optical Engineering
Journal
Identity
Digital Object Identifier (DOI)
10.1117/12.547190
Additional Document Info
start page
49
end page
60
volume
5470