Metal - polymer interfaces and their effect on the glass transition of thin polystyrene films

We present a study of polystyrene-metal interfaces and discuss the relationship between the interfacial structure and anomalies in the measured glass transition temperature (Tg) of thin metal capped polystyrene (PS) films. The PS films used in these studies were coated with an evaporated metal layer of either Aluminum (Al) or gold (Au) and the Tg values were measured with ellipsometry. Uncoated PS films were also measured and these samples showed Tg values that were reduced relative to the bulk value for film thicknesses (h) less than 40 nm. Films coated with Au were shown to have measured Tg values that were the same as the bulk value (Tgbulk=370 K) for all the film thicknesses studied (h ≥ 8nm). The Al coated PS films had measured Tg values that were the same as the uncoated PS films. The observed differences are discussed in terms of the differences in the structure of the metal-polymer interfaces produced during thermal evaporation of the metal layers. A novel sample preparation procedure was developed to enable us to use Atomic Force Microscopy (AFM) to directly measure the structure of the buried polymer-metal interfaces. The measurements performed on these systems support the suggestion that the interfacial structure is different for the two metal-polymer interfaces studied and that these differences may be the cause of the anomalies in the measured Tgs of these samples.