Conference
A Quality Framework to Check the Applicability of Engineering and Statistical Assumptions for Automated Gauges
Abstract
Authors
Bering TPK; Veldhuis SC
Pagination
pp. 319-325
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
August 1, 2010
DOI
10.1109/coase.2010.5584605
Name of conference
2010 IEEE International Conference on Automation Science and Engineering