Toggle navigation
Home
People
Departments
Research
About
Login
Search
Effect of process parameters on pad damage during Au and Cu ball bonding processes
Conferences
Overview
Identity
Additional Document Info
View All
Overview
authors
Qin, I
Shah, A
Huynh, C
Meyer, M
Mayer, M
Zhou, Norman
status
published
publication date
December 2009
published in
2009 11th Electronics Packaging Technology Conference
Journal
presented at event
2009 11th Electronics Packaging Technology Conference (EPTC)
Conference
Identity
Digital Object Identifier (DOI)
10.1109/eptc.2009.5416482
Additional Document Info
start page
573
end page
578