Conference
Coherent X-ray diffraction imaging meets ptychography to study core-shell-shell nanowires
Abstract
We report on the results of coherent X-ray diffraction imaging (CXDI) and ptychography measurements of two individual core-shell-shell GaAs/(In,Ga)As/GaAs nanowires (NWs) grown by molecular beam epitaxy (MBE) on patterned Si(111) substrate. CXDI at the axial GaAs 111 Bragg reflection was applied at different positions along the NW axis in order to characterize the NWs in terms of structural homogeneity along the radial directions. At each …
Authors
Davtyan A; Favre-Nicolin V; Lewis RB; Küpers H; Geelhaar L; Kriegner D; Bahrami D; Al-Hassan A; Chahine G; Loffeld O
Volume
3
Pagination
pp. 2317-2322
Publisher
Springer Nature
Publication Date
August 2018
DOI
10.1557/adv.2018.466
Conference proceedings
MRS Advances
Issue
39
ISSN
2731-5894