Conference
Detecting Spurious Reflections in Integrated Photonic Devices
Abstract
Spurious reflections can be a problematic issue in integrated optical devices, such as lasers [1], detectors [2], or multi-mode interference (MMI) couplers [3]. Here we demonstrate a simple method to localize such faint reflections occurring inside the chip, using only wavelength-swept power transmission measurements. The method does not require a special measurement setup and is based on minimum phase techniques, which were recently proposed …
Authors
Halir R; Molina-Fernández Í; Ortega-Moñux A; Cheben P; Janz S; Xu D-X
Volume
1
Pagination
pp. 1-1
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2009
DOI
10.1109/cleoe-eqec.2009.5194808
Name of conference
CLEO/Europe - EQEC 2009 - European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference