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Quality-improved MOCVD GaAs epitaxial layers on Si...
Conference

Quality-improved MOCVD GaAs epitaxial layers on Si substrate for photonics applications

Authors

Thilakan P; Xu C-Q

Volume

4594

Pagination

pp. 139-143

Publisher

SPIE, the international society for optics and photonics

Publication Date

October 29, 2001

DOI

10.1117/12.446540

Name of conference

Design, Fabrication, and Characterization of Photonic Devices II

Conference proceedings

Proceedings of SPIE--the International Society for Optical Engineering

ISSN

0277-786X