GaAs-based laser diode bonding-induced stress investigation by means of simulation and Degree of Polarization of photoluminescence measurements Conferences

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authors

LeClecH, Julien
Cassidy, Daniel Thomas
Biet, Michel
Laruelle, Francois
Bettiati, Mauro
Landesman, Jean-Pierre

status

published

publication date

April 2010

published in

2010 11th International Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE) Journal

presented at event

11th International. Conference on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE 2010) Conference