Conference
TLM-based Time Domain Adjoint Sensitivities: State of the Art and Outlook
Abstract
Authors
Bakr MH
Volume
1
Pagination
pp. 1-3
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2012
DOI
10.1109/mwsym.2012.6259410
Name of conference
2012 IEEE/MTT-S International Microwave Symposium Digest